Abstract:

In this paper, we propose a Bayesian inference approach to extract the binary reflectance pattern of samples from compressed measurements in the terahertz (THz) frequency band. Compared with existing compressed THz imaging methods relying on the sparsity of the reflectance pattern, the proposed Bayesian approach exploits the non-negative binary nature of the reflectance without any assumption on its spatial pattern information and enables a pixel-wise iterative inference approach for fast signal recovery. Numerical evaluation confirms the effectiveness of the proposed approach.